Low-Cost Solutions for Chip and Board Level TestsCAS Dataloggers Document - Sponsored Whitepaper

ADwin Real-Time Data Acquisition Systems

Depending on the complexity of analog and digital technology-based IC chips and electronic boards, there are different test solutions available for R&D and production line testing. While complex and expensive chips and boards are tested with large, sophisticated testers, more cost-effective test solutions are a necessity when testing low-cost chips and boards. A real-time system with a modular architecture such as the ADwin family of data acquisition devices makes an ideal and cost-effective platform to provide the necessary field tests of mixed signal testing for chips and boards. The ADwin system offers a selection of I/O cards including parallel analog I/O modules, parallel digital I/O modules, digital input modules with individual thresholds (comparator inputs), and large memory buffers for waveform storage, all with precise deterministic timing of all signals. Besides all these testing functions, the system can also be used as a FLASH programmer, providing the application with the high synergy of combining testing and programming in the same system.